| 数据搜索系统,热门电子元器件搜索 |
|
USBLC6-2P6 数据表(PDF) 6 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
USBLC6-2P6 数据表(HTML) 6 Page - STMicroelectronics |
|
6 / 14 page ![]() Technical information USBLC6-2 6/14 Important: A good precaution to take is to put the protection device as close as possible to the disturbance source (generally the connector). 2.4 Crosstalk behavior 2.4.1 Crosstalk phenomenon Figure 11. Crosstalk phenomenon The crosstalk phenomenon is due to the coupling between 2 lines. The coupling factor ( β12 or β21) increases when the gap across lines decreases, particularly in silicon dice. In the above example the expected signal on load RL2 is α2VG2, in fact the real voltage at this point has got an extra value β21VG1. This part of the VG1 signal represents the effect of the crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works with low voltage signal or high load impedance (few k Ω). Figure 9. ESD response to IEC 61000-4-2 (+15 kV air discharge) Figure 10. ESD response to IEC 61000-4-2 (-15 kV air discharge) Vin Vout Vin Vout Line 1 Line 2 VG1 VG2 RG1 RG2 DRIVERS RL1 RL2 RECEIVERS α β + 1 12 VG1 VG2 α β + 2 21 VG2 VG1 |
|
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |