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AAT1153 数据表(PDF) 4 Page - Advanced Analogic Technologies

部件名 AAT1153
功能描述  2A Step-Down Converter
PDF  19 Pages
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制造商  ANALOGICTECH [Advanced Analogic Technologies]
网页  http://www.analogictech.com
标志 ANALOGICTECH - Advanced Analogic Technologies

AAT1153 数据表(HTML) 4 Page - Advanced Analogic Technologies

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AAT1153
2A Step-Down Converter
PRODUCT DATASHEET
4
1153.2008.02.1.2
www .analogictech.com
AAT1153
2A Step-Down Converter
PRODUCT DATASHEET
4
1153.2008.02.1.2
www .analogictech.com
Electrical Characteristics1
VIN = 3.6V, TA = -40°C to +85°C unless otherwise noted; typical values are TA = 25°C.
Symbol Description
Conditions
Min
Typ
Max
Units
VIN
Input Voltage Range2
2.5
5.5
V
VOUT
Output Voltage Range
0.6
VIN
V
IQ
Input DC Supply Current
Active Mode: VFB = 0.5V
300
500
μA
Shutdown Mode: VEN = 0V, VAIN = 5.5V
0.1
1
μA
IFB
Feedback Input Bias Current
VFB = 0.65V
30
nA
VFB
Regulated Feedback Voltage3
TA = 25°C
0.5880
0.6000
0.6120
V
0°C ≤ TA ≤ 85°C
0.5865
0.6000
0.6135
-40°C ≤ TA ≤ 85°C
0.5850
0.6000
0.6150
ΔVLINEREG/
ΔVIN
Line Regulation
VIN = 2.5V to 5.5V, IOUT = 10mA
0.10
0.20
%/V
ΔVLOADREG/
ΔIOUT
Load Regulation
IOUT = 10mA to 2000mA
0.20
%/A
VFB
Output Voltage Accuracy
VIN = 2.5 to 5.5V, IOUT = 10 to 2000mA
-3
+3
% VOUT
FOSC
Oscillator Frequency
VFB = 0.6V
0.96
1.2
1.44
MHz
TS
Startup Time
From Enable to Output Regulation
1.3
ms
TSD
Over-Temperature Shutdown Threshold
170
°C
THYS
Over-Temperature Shutdown Hysteresis
10
°C
ILIM
Peak Switch Current
2.5
3.5
A
RDS(ON)
P-CH MOSFET
VIN = 3.6V
135
200
mΩ
N-CH MOSFET
VIN = 3.6V
95
150
VEN(L)
Enable Threshold Low
0.3
V
VEN(H)
Enable Threshold High
1.5
V
IEN
Input Low Current
VIN = VEN = 5.5V
-1.0
1.0
μA
1. The AAT1153 is guaranteed to meet performance specifications over the -40°C to +85°C operating temperature range and is assured by design, characterization, and correla-
tion with statistical process controls.
2. VIN should be not less than VOUT + VDROPOUT, where VDROPOUT = IOUT x (RDS(ON)PMOS + ESRINDUCTOR), typically VDROPOUT = 0.3V.
3. The regulated feedback voltage is tested in an internal test mode that connects VFB to the output of the error amplifier.



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