QST108CB1 datasheet(32/51 Pages) STMICROELECTRONICS

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Electrical characteristics

QST108

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6.3

EMC characteristics

Susceptibility tests are performed on a sample basis during product characterization.

6.3.1

Functional EMS (electro magnetic susceptibility)

The product is stressed by two electro magnetic events until a failure occurs:

●

ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the

device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2

standard.

●

FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and

VSS through a 100pF capacitor, until a functional disturbance occurs. This test

conforms with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed. The test results are given in the

table below based on the EMS levels and classes defined in application note AN1709.

6.3.2

Electro magnetic interference (EMI)

The product is monitored in terms of emission. This emission test is in line with the norm

SAE J 1752/3 which specifies the board and the loading of each pin.

Table 23.

Functional EMS

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on any I/O

pin to induce a functional disturbance

VDD=5V, TA=+25°C,

complies with IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VDD

pins to induce a functional disturbance

VDD=5V, TA=+25°C

complies with IEC 1000-4-4

Table 24.

EM emissions

Symbol

Parameter

Conditions

Monitored

Frequency Band

fDEVICE = 4 MHz

(1)

Data based on characterization results, not tested in production.

Unit

SEMI

Peak level

VDD=5V, TA=+25°C,

complies with SAE J

1752/3

0.1 MHz to 30 MHz

μV

30 MHz to 130 MHz

130 MHz to 1 GHz

SAE EMI Level

2.5

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