11/31

TDA7580

Note: 1. The leakage currents are generally very small, <1nA. The value given here, 1

µA, is the maximum that can occur after an Electro-

static Stress on the pin.

2. On pins:17 to 20,23 to 26,29 to 33,36 to 39,42 to 46,49 to 52,55 to 58.

3. On pins: 13 and 14.

4. Same check on the analogue pin 15 (phisically without pull-up-down)

5. On pins:25, 26,32,49,50,55,56

6. On pins:17 to 20,23 to 24,29 to 31,33,36 to 39,42 to 46,51, 52,57, 58

LOW VOLTAGE CMOS INTERFACE DC ELECTRICAL CHARACTERISTICS

Note: 1. It is the source/sink current under worst case conditions and reflects the name of the I/O cell according to the drive capability.

HIGH VOLTAGE CMOS INTERFACE DC ELECTRICAL CHARACTERISTICS

Note: 1. It is the source/sink current under worst case conditions and reflects the name of the I/O cell according to the drive capability

2. X=4mA for pins 17 to 20,29,30,32,36 to 39,42 to 46; X=8mA for pins 23 to 26,49 to 52,55 to 58.

5V Tolerant Tri-state Output

leakage (without pull up/down

device)

1

µA

1

3

µA

I/O latch-up current

200

mA

Electrostatic Protection

Leakage, 1

µA

2000

V

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

Low Level Input Voltage

1.70V

<=VDD<=1.90V

V

High Level Input Voltage

1.70V

<=VDD<=1.90V

V

Low level output Voltage

0.15

V

High level output Voltage

V

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

Low Level Input Voltage

3.15V

<=VDD3<=3.45V

0.8

V

High Level Input Voltage

3.15V

<=VDD3<=3.45V

2.0

V

Low level output Voltage

0.15

V

High level output Voltage

V

CURRENT CONSUMPTION

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

Supply

All digital blocks working

120

200

mA

Supply

All I/Os working with 5pF load

35

mA

Supply

36

45

54

mA

Supply

without quartz

5.5

8

10.5

mA

GENERAL INTERFACE ELECTRICAL CHARACTERISTICS (continued)

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit