SAF7115ET datasheet(21/35 Pages) NXP

21 / 35 page

SAF7115_1

Product data sheet

Rev. 01 — 15 October 2008

21 of 35

NXP Semiconductors

SAF7115

Multistandard video decoder

11. Test information

11.1 Quality information

This product has been qualiﬁed in accordance with the Automotive Electronics Council

(AEC) standard

Q100 - Stress test qualiﬁcation for integrated circuits, and is suitable for

use in automotive applications.

11.2 Boundary scan test

The SAF7115 has built-in logic and 5 dedicated pins to support boundary scan testing

which allows board testing without special hardware (nails). The SAF7115 follows the

IEEE Std. 1149.1 - Standard Test Access Port and Boundary-Scan Architecture set by the

Joint Test Action Group (JTAG).

The 5 dedicated pins are Test Mode Select (TMS), Test Clock (TCK), Test Reset

(TRST_N), Test Data Input (TDI) and Test Data Output (TDO).

The Boundary Scan Test (BST) functions BYPASS, EXTEST, SAMPLE, CLAMP and

IDCODE are all supported (see Table 10). Details about the JTAG BST-TEST can be

found in speciﬁcation

IEEE Std. 1149.1.

11.2.1 Initialization of boundary scan circuit

The Test Access Port (TAP) controller of an IC should be in the reset state

(TEST_LOGIC_RESET) when the IC is in the functional mode. The reset state also forces

the instruction register into a functional instruction such as IDCODE or BYPASS.

To compensate for the power-up reset, the standard speciﬁes that the TAP controller will

be forced asynchronously to the TEST_LOGIC_RESET state by setting the TRST_N pin

LOW.

Table 10.

BST instructions supported by the SAF7115

Instruction

Description

BYPASS

this mandatory instruction provides a minimum length serial path (1-bit) between TDI

and TDO when no test operation of the component is required

EXTEST

this mandatory instruction allows testing of off-chip circuitry and board level

interconnections

SAMPLE

this mandatory instruction can be used to take a sample of the inputs during normal

operation of the component; it can also be used to preload data values into the

latched outputs of the boundary scan register

CLAMP

this optional instruction is useful for testing when not all ICs have BST; this

instruction addresses the bypass register while the boundary scan register is in

external test mode

IDCODE

this optional instruction will provide information on the components manufacturer,

part number and version number

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