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WS27C256L-12 数据表(PDF) 2 Page - STMicroelectronics

部件名 WS27C256L-12
功能描述  Military 32K x 8 CMOS EPROM
PDF  5 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

WS27C256L-12 数据表(HTML) 2 Page - STMicroelectronics

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AC READ CHARACTERISTICS Over Operating Range (See Above)
SYMBOL
PARAMETER
WS27C256L-12
WS27C256L-15
WS27C256L-20
UNITS
MIN
MAX
MIN
MAX
MIN
MAX
tACC
Address to Output Delay
120
150
200
tCE
CE to Output Delay
120
150
200
tOE
OE to Output Delay
35
40
40
tDF
Output Disable to Output Float
35
40
40
ns
(Note 3)
Output Hold From Addresses,
tOH
CE or OE, Whichever Occurred
0
0
0
First (Note 3)
DC READ CHARACTERISTICS Over Operating Range. (See Above)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
MAX
UNITS
VIL
Input Low Voltage
–0.5
0.8
V
VIH
Input High Voltage
2.0
VCC + 1
V
VOL
Output Low Voltage
IOL = 2.1 mA
0.4
V
VOH
Output High Voltage
IOH = –400 µA
3.5
V
ISB1
VCC Standby Current (CMOS)
CE = VCC ± 0.3 V (Note 2)
100
µA
ISB2
VCC Standby Current
CE = VIH
1mA
ICC
VCC Active Current
CE = OE = VIL
F = 5 MHz
40
mA
(Note 1)
F = 8 MHz
50
mA
IPP
VPP Supply Current
VPP = VCC
100
µA
VPP
VPP Read Voltage
VCC –0.4
VCC
V
ILI
Input Leakage Current
VIN = 5.5 V or Gnd
–10
10
µA
ILO
Output Leakage Current
VOUT = 5.5 V or Gnd
–10
10
µA
WS27C256L
4-20
OPERATING RANGE
RANGE
TEMPERATURE
VCC
Military
–55°C to +125°C
+5V ± 10%
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature............................–65° to + 150°C
Voltage on any Pin with
Respect to Ground ....................................–0.6V to +7V
VPP with Respect to Ground...................–0.6V to + 14V
VCC Supply Voltage with
Respect to Ground ....................................–0.6V to +7V
ESD Protection ..................................................
>2000V
NOTES: 1. The supply current is the sum of ICC and IPP. The maximum current value is with Outputs O0 to O7 unloaded.
2. CMOS inputs: VIL = GND ± 0.3V, VIH = VCC ± 0.3 V.
*NOTICE:
Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of
time may affect device reliability.
NOTE:
3. This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven – see timing
diagram.



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