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TLC5952DAP 数据表(PDF) 2 Page - Texas Instruments |
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TLC5952DAP 数据表(HTML) 2 Page - Texas Instruments |
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2 / 33 page ![]() ABSOLUTE MAXIMUM RATINGS (1) (2) TLC5952 SBVS129 – MAY 2009........................................................................................................................................................................................................ www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) TRANSPORT MEDIA, PRODUCT PACKAGE-LEAD ORDERING NUMBER QUANTITY TLC5952DAPR Tape and Reel, 2000 TLC5952 HTSSOP-32 PowerPAD™ TLC5952DAP Tube, 46 TLC5952RHBR Tape and Reel, 3000 TLC5952 5-mm × 5-mm QFN-32(2) TLC5952RHBT Tape and Reel, 250 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Product preview device. Over operating free-air temperature range, unless otherwise noted. PARAMETER TLC5952 UNIT VCC Supply voltage VCC –0.3 to +6.0 V OUTR0-OUTR7, OUTG0-OUTG7 45 mA IOUT Output current (dc) OUTB0-OUTB7 35 mA VIN Input voltage range SIN, SCLK, LAT, BLANK, IREF –0.3 to VCC + 0.3 V SOUT –0.3 to VCC + 0.3 V VOUT Output voltage range OUTR0-OUTR7, OUTG0-OUTG7, –0.3 to +16 V OUTB0-OUTB7 TJ(max) Operation junction temperature +150 °C TSTG Storage temperature range –55 to +150 °C Human body model (HBM) 2000 V ESD rating Charged device model (CDM) 500 V (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to network ground terminal. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TLC5952 |
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