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BQ20Z45DBTR-R1 数据表(PDF) 7 Page - Texas Instruments |
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BQ20Z45DBTR-R1 数据表(HTML) 7 Page - Texas Instruments |
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7 / 18 page ![]() bq20z45-R1 www.ti.com SLUS992 – DECEMBER 2009 ELECTRICAL CHARACTERISTICS (continued) over operating free-air temperature range (unless otherwise noted), TA = –40°C to 85°C, V(REG25) = 2.41 V to 2.59 V, V(BAT) = 14 V, C(REG25) = 1 µF, C(REG33) = 2.2 µF; typical values at TA = 25°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT V(CHG): V(PACK) ≥ V(PACK) + 4V 400 1000 tr Rise time CL= 4700 pF μs V(DSG): V(BAT) ≥ V(BAT) + 4V 400 1000 V(CHG): V(PACK) + V(CHGON) ≥ V(PACK) 40 200 + 1V tf Fall time CL= 4700pF μs V(DSG): VC1 + V(DSGON) ≥ VC1 + 1V 40 200 V(ZVCHG) ZVCHG clamp voltage BAT = 4.5 V 3.3 3.5 3.7 V LOGIC; TA = –40°C to 100°C (unless otherwise noted) ALERT 60 100 200 R(PULLUP) Internal pullup resistance k Ω RESET 1 3 6 ALERT 0.2 VOL Logic low output voltage level RESET; V(BAT) = 7V; V(REG25) = 1.5 V; I (RESET) = 200 μA 0.4 V GPOD; I(GPOD) = 50 μA 0.6 LOGIC SMBC, SMBD, PFIN, PRES, SAFE, ALERT VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V VOH Output voltage high(1) IL = –0.5 mA VREG25–0.5 V VOL Low-level output voltage PRES, PFIN, ALERT, IL = 7 mA; 0.4 V CI Input capacitance 5 pF I(SAFE) SAFE source currents SAFE active, SAFE = V(REG25) –0.6 V –3 mA SAFE leakage current SAFE inactive –0.2 0.2 µA Ilkg Input leakage current 1 µA ADC(2) Input voltage range TS1, TS2, using Internal Vref –0.2 1 V Conversion time 31.5 ms Resolution (no missing codes) 16 bits Effective resolution 14 15 bits Integral nonlinearity ±0.03 %FSR(3) Offset error(4) 140 250 µV Offset error drift(4) TA = 25°C to 85°C 2.5 18 μV/°C Full-scale error(5) ±0.1% ±0.7% Full-scale error drift 50 PPM/°C Effective input resistance(6) 8 M Ω COULOMB COUNTER Input voltage range –0.20 0.20 V Conversion time Single conversion 250 ms Effective resolution Single conversion 15 bits –0.1 V to 0.20 V ±0.007 ±0.034 Integral nonlinearity %FSR –0.20 V to –0.1 V ±0.007 Offset error (7) TA = 25°C to 85°C 10 µV Offset error drift 0.4 0.7 µV/°C Full-scale error(8) (9) ±0.35% Full-scale error drift 150 PPM/°C (1) RC[0:7] bus (2) Unless otherwise specified, the specification limits are valid at all measurement speed modes (3) Full-scale reference (4) Post-calibration performance and no I/O changes during conversion with SRN as the ground reference (5) Uncalibrated performance. This gain error can be eliminated with external calibration. (6) The A/D input is a switched-capacitor input. Since the input is switched, the effective input resistance is a measure of the average resistance. (7) Post-calibration performance (8) Reference voltage for the coulomb counter is typically Vref/3.969 at V(REG25) = 2.5 V, TA = 25°C. (9) Uncalibrated performance. This gain error can be eliminated with external calibration. Copyright © 2009, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Link(s): bq20z45-R1 |
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