INA333-HT

www.ti.com

SBOS514 – MARCH 2010

Micro-Power, Zerø-Drift, Rail-to-Rail Out

Instrumentation Amplifier

Check for Samples: INA333-HT

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FEATURES

SUPPORTS EXTREME TEMPERATURE

APPLICATIONS

2

•

Low Offset Voltage: 25 mV (max at 25°C),

•

Controlled Baseline

G

≥ 100

•

One Assembly/Test Site

•

Low Drift: 0.2 mV/°C, G ≥ 1000

•

One Fabrication Site

•

Low Noise: 55 nV/

√Hz, G ≥ 100

•

Available in Extreme (–55°C/210°C)

•

High CMRR: 100 dB (min at 25°C), G

≥ 10

•

Supply Range: +1.8 V to +5.5 V

•

Extended Product Life Cycle

•

Input Voltage: (V–) +0.1 V to (V+) –0.1 V

•

Extended Product-Change Notification

•

Output Range: (V–) +0.05 V to (V+) –0.05V

•

Product Traceability

•

Low Quiescent Current: 198 mA

•

Texas Instruments' high temperature products

utilize highly optimized silicon (die) solutions

•

RFI Filtered Inputs

with design and process enhancements to

maximize performance over extended

APPLICATIONS

temperatures.

•

Down-Hole Drilling

•

High Temperature Environments

(1)

Custom temperature ranges available

DESCRIPTION

The INA333 is a low-power, precision instrumentation amplifier offering excellent accuracy. The versatile 3-op

amp design, small size, and low power make it ideal for a wide range of portable applications.

A single external resistor sets any gain from 1 to 1000. The INA333 is designed to use an industry-standard gain

equation: G = 1 + (100k

The INA333 provides very low offset voltage (25 mV at 25°C, G ≥ 100), excellent offset voltage drift (0.2 mV/°C,

G

≥ 100), and high common-mode rejection (100 dB at 25°C, G ≥ 10). It operates with power supplies as low as

1.8 V (±0.9V), and quiescent current is only 50 mA—ideal for battery-operated systems. Using autocalibration

techniques to ensure excellent precision over the extended industrial temperature range, the INA333 also offers

exceptionally low noise density (55 nV/

√Hz) that extends down to dc.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2010, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.