WM2604

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 June 1999

4

ELECTRICAL CHARACTERISTICS

Test Conditions:

Ω, C

recommended operating free-air temperature range (unless noted otherwise).

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Static DAC Specifications

Resolution

10

bits

Integral non-linearity

INL

See Note 1

LSB

Differential non-linearity

DNL

See Note 2

LSB

Zero code error

ZCE

See Note 3

3

mV

Gain error

GE

See Note 4

0.25

% FSR

d.c. power supply rejection ratio

DC PSRR

See Note 5

0.5

mV/V

Zero code error temperature coefficient

See Note 6

10

ppm/

°C

Gain error temperature coefficient

See Note 6

10

ppm/

°C

DAC Output Specifications

Output voltage range

0

AVDD - 0.1

V

Output load regulation

2k

Ω to 10kΩ load

See Note 7

0.1

0.25

%

Power Supplies

AVDD = 5V,

1.4

2.2

AVDD = 5V,

3.5

5.5

AVDD = 3V,

1.0

1.5

Active supply current

AVDD = 3V,

See Note 8

3.0

4.5

mA

Power down supply current

No load, all digital inputs

0V or DVDD

See Note 9

0.01

10

µA

Dynamic DAC Specifications

Slew rate

DAC code 32 to 1023,

10% to 90%

Slow

Fast

See Note 10

0.5

2.5

1.0

4.0

V/

µs

V/

µs

Settling time

DAC code 32 to 1023

Slow

Fast

See Note 11

12.0

4.0

µs

µs

Glitch energy

Code 511 to 512

10

nV-s

Signal to noise ratio

SNR

BW = 20kHz

See Note 12

60

68

dB

Signal to noise and distortion ratio

SNRD

BW = 20kHz

See Note 12

54

65

dB

Total harmonic distortion

THD

BW = 20kHz

See Note 12

-68

-54

dB

Spurious free dynamic range

SPFDR

BW = 20kHz

See Note 12

54

70

dB