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ADT7485AARMZ-R7 数据表(PDF) 9 Page - ON Semiconductor |
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ADT7485AARMZ-R7 数据表(HTML) 9 Page - ON Semiconductor |
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9 / 12 page ![]() ADT7485A http://onsemi.com 9 Table 6. Maximum Reported Input Voltages Voltage Channel Full−Scale Voltage 12 V 16 V 5.0 V 8.0 V VCC 4.0 V 2.5 V 4.0 V VCCP 4.0 V Input Circuitry The internal structure for the analog inputs is shown in Figure 14. The input circuit consists of an input protection diode and an attenuator, plus a capacitor that forms a first−order, low−pass filter to provide input immunity to high frequency noise. Figure 14. Internal Structure of Analog Inputs VCCP 17.5k 52.5k 35pF 2.5VIN 45k 94k 30pF 3.3VIN 68k 71k 30pF 5VIN 93k 47k 30pF 12VIN 120k 20k 30pF MUX W W W W W W W W W W Voltage Measurement Command Codes The voltage measurement command codes are detailed in Table 7. Each voltage measurement has a read length of two bytes in little endian format (LSB followed by MSB). All voltages can be read together by addressing Command Code 0x10 with a read length of 0x10. The data is retrieved in the order listed in Table 7. Table 7. Voltage Measurement Command Code Voltage Channel Command Code Returned Data 12 V 0x10 LSB, MSB 5.0 V 0x11 LSB, MSB VCC 0x12 LSB, MSB 2.5 V 0x13 LSB, MSB VCCP 0x14 LSB, MSB Voltage Data Format The returned voltage value is in twos complement, 16−bit, binary format. The format is structured so that voltages in the range of ±32 V can be reported. In this way, the reported value represents the number of 1/1024 V in the actual reading, allowing a resolution of approximately 1 mV. Table 8. Analog−to−Digital Output vs. VIN Voltage Twos Complement MSB LSB 12 0011 0000 0000 0000 5.0 0001 0100 0000 0000 3.3 0000 1101 0011 0011 3.0 0000 1100 0000 0000 2.5 0000 1010 0000 0000 1.0 0000 0100 0000 0000 0 0000 0000 0000 0000 Temperature Measurement The ADT7485A has two dedicated temperature measurement channels: one for measuring the temperature of an on−chip band gap temperature sensor, and one for measuring the temperature of a remote diode, usually located in the CPU or GPU. The ADT7485A monitors one local and one remote temperature channel. Monitoring of each of the channels is done in a round−robin sequence. The monitoring sequence is in the order shown in Table 9. Table 9. Temperature Monitoring Sequence Channel Number Measurement Conversion Time (ms) 0 Local temperature 12 1 Remote 1 temperature 38 Temperature Measurement Method A simple method for measuring temperature is to exploit the negative temperature coefficient of a diode by measuring the base−emitter voltage (VBE) of a transistor operated at constant current. Unfortunately, this technique requires calibration to null the effect of the absolute value of VBE, which varies from device to device. The technique used in the ADT7485A measures the change in VBE when the device is operated at three different currents. Figure 15 shows the input signal conditioning used to measure the output of a remote temperature sensor. This figure shows the remote sensor as a substrate transistor, which is provided for temperature monitoring on some microprocessors, but it could also be a discrete transistor. If a discrete transistor is used, the collector is not grounded and should be linked to the base. To prevent ground noise from interfering with the measurement, the more negative terminal of the sensor is not referenced to ground, but is biased above ground by an internal diode at the D1− input. If the sensor is operating in an extremely noisy environment, C1 can be added as a noise filter. Its value should not exceed 1000 pF. |
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