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ST10F272Z2 数据表(PDF) 147 Page - STMicroelectronics |
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ST10F272Z2 数据表(HTML) 147 Page - STMicroelectronics |
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147 / 189 page ![]() ST10F272Z2 Electrical characteristics 147/189 ‘LSB’ has a value of VAREF/1024. For Port5 channels, the specified TUE (± 2LSB) is guaranteed also with an overload condition (see IOV specification) occurring on maximum 2 not selected analog input pins of Port5 and the absolute sum of input overload currents on all Port5 analog input pins does not exceed 10 mA. For Port1 channels, the specified TUE is guaranteed when no overload condition is applied to Port1 pins: when an overload condition occurs on maximum 2 not selected analog input pins of Port1 and the input positive overload current on all analog input pins does not exceed 10 mA (either dynamic or static injection), the specified TUE is degraded (± 7LSB). To get the same accuracy, the negative injection current on Port1 pins shall not exceed -1mA in case of both dynamic and static injection. 7. The coupling factor is measured on a channel while an overload condition occurs on the adjacent not selected channels with the overload current within the different specified ranges (for both positive and negative injection current). 8. Refer to scheme reported in Figure 43. 25.7.1 Conversion timing control When a conversion is started, first the capacitances of the converter are loaded via the respective analog input pin to the current analog input voltage. The time to load the capacitances is referred to as sample time. Next the sampled voltage is converted to a digital value several successive steps, which correspond to the 10-bit resolution of the ADC. During these steps the internal capacitances are repeatedly charged and discharged via the VAREF pin. The current that has to be drawn from the sources for sampling and changing charges depends on the time that each respective step takes, because the capacitors must reach their final voltage level within the given time, at least with a certain approximation. The maximum current, however, that a source can deliver, depends on its internal resistance. The time that the two different actions during conversion take (sampling, and converting) can be programmed within a certain range in the ST10F272Z2 relative to the CPU clock. The absolute time that is consumed by the different conversion steps therefore is independent from the general speed of the controller. This allows adjusting the A/D converter of the ST10F272Z2 to the properties of the system: Fast conversion can be achieved by programming the respective times to their absolute possible minimum. This is preferable for scanning high frequency signals. The internal resistance of analog source and analog supply must be sufficiently low, however. High internal resistance can be achieved by programming the respective times to a higher value, or the possible maximum. This is preferable when using analog sources and supply with a high internal resistance in order to keep the current as low as possible. The conversion rate in this case may be considerably lower, however. The conversion times are programmed via the upper four bits of register ADCON. Bit fields ADCTC and ADSTC are used to define the basic conversion time and in particular the partition between sample phase and comparison phases. The table below lists the possible combinations. The timings refer to the unit TCL, where fCPU = 1/2TCL. A complete conversion time includes the conversion itself, the sample time and the time required to transfer the digital value to the result register. Table 69. A/D converter programming ADCTC ADSTC Sample Comparison Extra Total conversion 00 00 TCL * 120 TCL * 240 TCL * 28 TCL * 388 00 01 TCL * 140 TCL * 280 TCL * 16 TCL * 436 00 10 TCL * 200 TCL * 280 TCL * 52 TCL * 532 00 11 TCL * 400 TCL * 280 TCL * 44 TCL * 724 |
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