SL2S2002_SL2S2102_SDS

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© NXP B.V. 2011. All rights reserved.

Product short data sheet

PUBLIC

Rev. 3.2 — 10 January 2011

198332

3 of 13

NXP Semiconductors

SL2S2002; SL2S2102

ICODE SLIX

4.

Quick reference data

[1]

Bandwidth limitation (

± 7 kHz) according to ISM band regulations.

[2]

Measured with an HP4285A LCR meter at 13.56 MHz and 2 V RMS.

5.

Ordering information

Table 1.

Quick reference data

Typical ratings are not guaranteed. The values listed are at room temperature.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Wafer EEPROM characteristics

retention time

50

--year

write endurance

100000

-

-

cycle

Interface characteristics

input frequency

[1] 13.553

13.56

13.567

MHz

input capacitance

between LA and LB

[2]

SL2S2002FUD

SL2S2002FTB

22.3

23.5

24.7

pF

SL2S2102FUD

SL2S2102FTB

92

97

102

pF

Table 2.

Ordering information

Type number

Package

Version

Name

Description

SL2S2002FUD

wafer

sawn, bumped wafer, 120

μm, on film frame carrier,

-

SL2S2102FUD

wafer

sawn, bumped wafer, 120

μm, on film frame carrier,

-

SL2S2002FTB

XSON3

plastic extremely thin small outline package; no leads;

3 terminals; body 1 x 1.45 x 0.5 mm;

SOT1122

SL2S2102FTB

XSON3

plastic extremely thin small outline package; no leads;

3 terminals; body 1 x 1.45 x 0.5 mm;

SOT1122