TL(RH,RMH,SH,OH,YH)30TP(F)

2009-03-09

2

Product Name

Forward Current

Reverse Voltage

Power Dissipation

Operating

Temperature

Storage

Temperature

TLRH30TP(F)

TLRMH30TP(F)

TLSH30TP(F)

TLOH30TP(F)

TLYH30TP(F)

50

4

120

−40 to 100

−40 to 120

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even

if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Note 1: Forward current derating

Ambient temperature Ta (°C)

40

0

120

60

0

40

80

20

20

60

80

100