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LIS331HH 数据表(PDF) 9 Page - STMicroelectronics |
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LIS331HH 数据表(HTML) 9 Page - STMicroelectronics |
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9 / 37 page ![]() LIS331HH Mechanical and electrical specifications Doc ID 16366 Rev 1 9/37 2 Mechanical and electrical specifications 2.1 Mechanical characteristics Table 3. Mechanical characteristics @ Vdd = 2.5 V, T = 25 °C unless otherwise noted (1) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit FS Measurement range(3) FS bit set to 00 ±6 g FS bit set to 01 ±12 FS bit set to 11 ±24 So Sensitivity FS bit set to 00 12 bit representation 3 m g/digit FS bit set to 01 12 bit representation 6 FS bit set to 11 12 bit representation 12 TCSo Sensitivity change vs temperature FS bit set to 00 ±0.01 %/°C TyOff Typical zero- g level offset accuracy(4),(5) FS bit set to 00 ±70 m g TCOff Zero- g level change vs temperature Max delta from 25 °C ±0.4 m g/°C An Acceleration noise density FS bit set to 00 650 µ g/ Vst Self-test output change(6),(7),(8) FS bit set to 00 X axis 50 110 180 LSb FS bit set to 00 Y axis -50 -100 -180 LSb FS bit set to 00 Z axis 220 290 370 LSb Top Operating temperature range -40 +85 °C Wh Product weight 20 mgram 1. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V. 2. Typical specifications are not guaranteed 3. Verified by wafer level test and measurement of initial offset and sensitivity 4. Typical zero- g level offset value after MSL3 preconditioning 5. Offset can be eliminated by enabling the built-in high pass filter 6. The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit ( Table 27), for all axes. 7. Self-test output changes with the power supply. “Self-test output change” is defined as OUTPUT[LSb](CTRL_REG4 ST bit=1) - OUTPUT[LSb](CTRL_REG4 ST bit=0). 1LSb=12g/4096 at 12bit representation, ±6 g Full- scale 8. Output data reach 99% of final value after 1/ODR+1ms when enabling self-test mode, due to device filtering Hz |
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