Analog Integrated Circuit Device Data



Freescale Semiconductor

5

33663

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 3. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Ratings

Symbol

Value

Unit

ELECTRICAL RATINGS

Power Supply Voltage (VSUP)

Normal Operation (DC)

Transient input voltage with external component (according to ISO7637-2 &

ISO7637-3 & “Hardware Requirements for LIN, CAN, and Flexray Interfaces

in Automotive Applications” specification Rev. 1.1/December 2nd, 2009) (See

Table 4 and Figure 4)

- Pulse 1 (test up to the limit for Damage - Class A(1))

- Pulse 2a (test up to the limit for Damage - Class A(1))

- Pulse 3a (test up to the limit for Damage - Class A(1))

- Pulse 3b (test up to the limit for Damage - Class A(1))

- Pulse 5b (Class A)(1)

-0.3 to 27

-100

+75

-150

+100

-0.3 to 40

V

-0.3 to 5.5

V

Normal Operation with in series 2*18 k

 resistor (DC)

Transient input voltage with external component (according to ISO7637-2 &

ISO7637-3 & “Hardware Requirements for LIN, CAN and Flexray Interfaces

in Automotive Applications” specification Rev1.1 / December 2nd, 2009) (See

Table 4 and Figure 5)

- Pulse 1 (test up to the limit for Damage - Class D(2))

- Pulse 2a (test up to the limit for Damage - Class D(2))

- Pulse 3a (test up to the limit for Damage - Class D(2))

- Pulse 3b (test up to the limit for Damage - Class D(2))

-27 to 40

-100

+75

-150

+100

V

Normal Operation (DC)

Transient (Coupled Through 1.0 nF Capacitor) (according to ISO7637-2 &

ISO7637-3) (See Table 4 and Figure 6)

- Pulse 1 (test up to the limit for Damage - Class D(2))

- Pulse 2a (test up to the limit for Damage - Class D(2))

- Pulse 3a (test up to the limit for Damage - Class D(2))

- Pulse 3b (test up to the limit for Damage - Class D(2))

-27 to 40

-100

+75

-150

+100

V

Notes

1.

Class A: All functions of a device/system perform as designed during and after exposure to disturbance.

2.

Class D: At least one function of the Transceiver stops working properly during the test and will return into proper operation automatically

when the exposure to the disturbance has ended. No physical damage of the IC occurs.