1

2

3

4

8

7

6

5

HKJ PACKAGE

(TOP VIEW)

DNC

V

IN

TEMP

GND

TRIM/NR

V

OUT

NC

DNC

DNC = Do not connect

NC = No internal connection

HKQ PACKAGE

(TOP VIEW)

8

5

4

1

TRIM/NR

V

OUT

NC

DNC

DNC

V

IN

TEMP

GND

HKQ as formed or HKJ mounted dead bug

REF5025-HT

www.ti.com

SBOS502D – SEPTEMBER 2009 – REVISED APRIL 2012

LOW NOISE, VERY LOW DRIFT, PRECISION VOLTAGE REFERENCE

Check for Samples: REF5025-HT

1

FEATURES

2

•

Low Temperature Drift: 40 ppm/°C

•

Low Noise: 3

•

High Output Current: ±7 mA

APPLICATIONS

•

Down-Hole Drilling

•

High Temperature Environments

SUPPORTS EXTREME TEMPERATURE

APPLICATIONS

•

Controlled Baseline

•

One Assembly/Test Site

•

One Fabrication Site

•

Available in Extreme (–55°C/210°C)

•

Extended Product Life Cycle

•

Extended Product-Change Notification

•

Product Traceability

•

Texas Instruments high temperature products

utilize highly optimized silicon (die) solutions

with design and process enhancements to

maximize performance over extended

temperatures.

(1)

Custom temperature ranges available

DESCRIPTION

The REF5025 is a low-noise, low-drift, very high precision voltage reference. This reference is capable of both

sinking and sourcing, and is very robust with regard to line and load changes.

Temperature drift (40 ppm/°C) from –55°C to 210°C is achieved using proprietary design techniques. These

features combined with very low noise make the REF5025 ideal for use in down-hole drilling applications.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2009–2012, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.