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AD7713 数据表(PDF) 13 Page - Analog Devices |
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AD7713 数据表(HTML) 13 Page - Analog Devices |
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13 / 28 page ![]() 2 –13– REV. C AD7713 The AD7713 gives the user access to the on-chip calibration registers allowing the microprocessor to read the device’s cali- bration coefficients and also to write its own calibration coeffi- cients to the part from prestored values in E 2PROM. This gives the microprocessor much greater control over the AD7713’s calibration procedure. It also means that the user can verify that the device has performed its calibration correctly by comparing the coefficients after calibration with prestored values in E 2PROM. For battery operation or low power systems, the AD7713 offers a standby mode (controlled by the STANDBY pin) that reduces idle power consumption to typically 150 µW. THEORY OF OPERATION The general block diagram of a sigma-delta ADC is shown in Figure 4. It contains the following elements: 1. A sample-hold amplifier. 2. A differential amplifier or subtracter. 3. An analog low-pass filter. 4. A 1-bit A/D converter (comparator). 5. A 1-bit DAC. 6. A digital low-pass filter. S/H AMP ANALOG LOW-PASS FILTER DAC COMPARATOR DIGITAL FILTER DIGITAL DATA Figure 4. General Sigma-Delta ADC In operation, the analog signal sample is fed to the subtracter, along with the output of the 1-bit DAC. The filtered difference signal is fed to the comparator, whose output samples the differ- ence signal at a frequency many times that of the analog signal sampling frequency (oversampling). Oversampling is fundamental to the operation of sigma-delta ADCs. Using the quantization noise formula for an ADC: SNR = (6.02 × number of bits + 1.76) dB, a 1-bit ADC or comparator yields an SNR of 7.78 dB. The AD7713 samples the input signal at a frequency of 7.8 kHz or greater (see Table III). As a result, the quantization noise is spread over a much wider frequency than that of the band of interest. The noise in the band of interest is reduced still further by analog filtering in the modulator loop, which shapes the quantization noise spectrum to move most of the noise energy to frequencies outside the bandwidth of interest. The noise perfor- mance is thus improved from this 1-bit level to the performance outlined in Tables I and II and in Figure 2. The output of the comparator provides the digital input for the 1-bit DAC, so that the system functions as a negative feedback loop that tries to minimize the difference signal. The digital data that represents the analog input voltage is contained in the duty cycle of the pulse train appearing at the output of the compara- tor. It can be retrieved as a parallel binary data word using a digital filter. Sigma-delta ADCs are generally described by the order of the analog low-pass filter. A simple example of a first order sigma- delta ADC is shown in Figure 5. This contains only a first order low-pass filter or integrator. It also illustrates the derivation of the alternative name for these devices: Charge Balancing ADCs WIN FS COMPARATOR DIFFERENTIAL AMPLIFIER INTEGRATOR FS DAC ∫ Figure 5. Basic Charge-Balancing ADC It consists of a differential amplifier (whose output is the differ- ence between the analog input and the output of a 1-bit DAC), an integrator and a comparator. The term charge balancing, comes from the fact that this system is a negative feedback loop that tries to keep the net charge on the integrator capacitor at zero by balancing charge injected by the input voltage with charge injected by the 1-bit DAC. When the analog input is zero, the only contribution to the integrator output comes from the 1-bit DAC. For the net charge on the integrator capacitor to be zero, the DAC output must spend half its time at +FS and half its time at –FS. Assuming ideal components, the duty cycle of the comparator will be 50%. When a positive analog input is applied, the output of the 1-bit DAC must spend a larger proportion of the time at +FS, so the duty cycle of the comparator increases. When a negative input voltage is applied, the duty cycle decreases. The AD7713 uses a second-order sigma-delta modulator and a digital filter that provides a rolling average of the sampled out- put. After power-up or if there is a step change in the input voltage, there is a settling time that must elapse before valid data is obtained. Input Sample Rate The modulator sample frequency for the device remains at fCLK IN/512 (3.9 kHz @ fCLK IN = 2 MHz) regardless of the selected gain. However, gains greater than ×1 are achieved by a combination of multiple input samples per modulator cycle and a scaling of the ratio of reference capacitor to input capacitor. As a result of the multiple sampling, the input sample rate of the device varies with the selected gain (see Table III). The ef- fective input impedance is 1/C × f S where C is the input sam- pling capacitance and fS is the input sample rate. Table III. Input Sampling Frequency vs. Gain Gain Input Sampling Frequency (fS) 1fCLK IN/256 (7.8 kHz @ fCLK IN = 2 MHz) 22 × f CLK IN/256 (15.6 kHz @ fCLK IN = 2 MHz) 44 × f CLK IN/256 (31.2 kHz @ fCLK IN = 2 MHz) 88 × f CLK IN/256 (62.4 kHz @ fCLK IN = 2 MHz) 16 8 × f CLK IN/256 (62.4 kHz @ fCLK IN = 2 MHz) 32 8 × f CLK IN/256 (62.4 kHz @ fCLK IN = 2 MHz) 64 8 × f CLK IN/256 (62.4 kHz @ fCLK IN = 2 MHz) 128 8 × f CLK IN/256 (62.4 kHz @ fCLK IN = 2 MHz) |
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