AD9042

–4–

REV. A

ORDERING GUIDE

Model

Temperature Range

Package Description

Package Option

AD9042AST

–40

°C to +85°C (Ambient)

44-Pin TQFP (Thin Quad Plastic Flatpack)

ST-44

AD9042AD

–40

°C to +85°C (Ambient)

28-Pin 600 Mil Hermetic Ceramic DIP (DH-28)

DH-28

AD9042CHIPS

–40

°C to +85°C (Ambient)

Unpackaged Die

AD9042ST/PCB

Evaluation Board with AD9042AST

AD9042D/PCB

Evaluation Board with AD9042AD

AD9042CHIPS

Parameter

Temp

Min

Max

Units

POWER SUPPLY

+25

°C

90

147

mA

ENCODE Input

Logic “1” Current

+25

°C

450

800

µA

Logic “0” Current

+25

°C

–400

–200

µA

DC ACCURACY

Offset Error

+25

°C–8

8

mV

Gain Error

+25

°C

–6

6

% FS

No Missing Codes

+25

°C

Guaranteed

Differential Nonlinearity @ 5.3 MSPS

+25

°C

–0.995

LSB

NOTES

packaging is not guaranteed for standard product dice.

ABSOLUTE MAXIMUM RATINGS

1

Parameter

Min

Max

Units

ELECTRICAL

0

7

V

0

7

V

Analog Input Voltage

0.5

4.5

V

Analog Input Current

20

mA

Digital Input Voltage (ENCODE)

0

ENCODE, ENCODE Differential

Voltage

4

V

Digital Output Current

–40

40

mA

ENVIRONMENTAL

2

Operating Temperature Range

(Ambient)

–40

+85

°C

Maximum Junction Temperature

AD9042AD

+175

°C

AD9042AST

+150

°C

Lead Temperature (Soldering, 10 sec)

+300

°C

Storage Temperature Range (Ambient) –65

+150

°C

NOTES

beyond which the serviceability of the circuit may be impaired. Functional

operability is not necessarily implied. Exposure to absolute maximum rating

conditions for an extended period of time may affect device reliability.

θ

WARNING!

ESD SENSITIVE DEVICE

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD9042 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

EXPLANATION OF TEST LEVELS

Test Level

I

–

100% production tested.

II

–

100% production tested at +25

°C, and sample tested at

specified temperatures. AC testing done on sample

basis.

III –

Sample tested only.

IV –

Parameter is guaranteed by design and characterization

testing.

V

–

Parameter is a typical value only.

VI –

All devices are 100% production tested at +25

°C;

sample tested at temperature extremes.