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SWBF0B 数据表(PDF) 9 Page - Seoul Semiconductor |
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SWBF0B 数据表(HTML) 9 Page - Seoul Semiconductor |
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9 / 17 page ![]() Rev. 01 Rev. 01 February, 2013 February, 2013 www.acrich.com www.acrich.com Document No. : QP-7-07-18 (Rev.00) 공통_을 [ [9 9 /17] /17] Item Symbol Condition Criteria for Judgement MIN MAX Forward Voltage V F I F =20mA - I.V. *1 × 1.2 Reverse Current I R V R=5V - U.S.L.*2 × 2.0 Luminous Intensity I V I F =20mA I.V. × 0.7 - Note : *1 I.V. : Initial Value *2 U.S.L. : Upper Standard Level * Criteria for Judging the Damage 5. Reliability Test * TEST ITEMS AND RESULTS Item Reference Test Condition Duration / Cycle Number of Damage Life Test - T a = 25℃, IF = 20mA 1,000 Hours 0/20 High Temperature Life Test - T a = 85℃, IF = 5mA 1,000 Hours 0/20 Low Temperature Life Test - T a = -30℃, IF = 20mA 1,000 Hours 0/20 High Humidity Heat Life Test JEITA ED-4701 100 102 T a = 60℃, RH = 90%, IF = 20mA 500 Hours 0/20 High Temperature Storage JEITA ED-4701 200 201 T a = 100℃ 1,000 Hours 0/20 Low Temperature Storage JEITA ED-4701 200 202 T a = -40℃ 1,000 Hours 0/20 Temperature Cycle JEITA ED-4701 100 105 -40℃ ~ 25℃ ~ 100℃ ~ 25℃ (30min) (5min) (30min) (5min) 100 cycle 0/50 |
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