Data Sheet

AD5263

Rev. F | Page 13 of 28

TEST CIRCUITS

Figure 29 to Figure 39 define the test conditions used in the Electrical Characteristics—20 KΩ, 50 KΩ, 200 KΩ Versions section and the

Timing Characteristics—20 KΩ, 50 KΩ, 200 KΩ Versions.

A

W

B

DUT

V+

Figure 29. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)

NO CONNECT

A

W

B

DUT

Figure 30. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

A

W

B

DUT

Figure 31. Test Circuit for Wiper Resistance

ΔV

PSS (%/%) =

PSRR (dB) = 20 log

MS

DD

A

W

B

V+

ΔV

ΔV

ΔV

Figure 32. Test Circuit for Power Supply Sensitivity (PSS, PSRR)

OP279

W

5V

B

OFFSET

GND

OFFSET

BIAS

DUT

A

Figure 33. Test Circuit for Inverting Gain

B

A

OP279

W

5V

OFFSET

GND

OFFSET

BIAS

DUT

Figure 34. Test Circuit for Noninverting Gain

+15V

–15V

W

A

2.5V

B

OFFSET

GND

DUT

AD8610

Figure 35. Test Circuit for Gain vs. Frequency

W

B

DUT

CODE = 0x00

0.1V

0.1V

Figure 36. Test Circuit for Incremental On Resistance