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T830-8FP 数据表(PDF) 4 Page - STMicroelectronics |
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T830-8FP 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 9 page ![]() Characteristics T830-8FP 4/9 Doc ID 023366 Rev 1 Figure 5. Relative variation of gate trigger current versus junction temperature (typical values) Figure 6. Relative variation of gate trigger voltage versus junction temperature (typical values) I [T ] / I [T = 25 °C] GT j GT j 0.0 0.5 1.0 1.5 2.0 -50 -25 0 25 50 75 100 125 IQ1 GT IQ3 GT IQ2 GT T (°C) C V [T ] / V [T = 25 °C] GT j GT j 0.0 0.5 1.0 1.5 -50 -25 0 25 50 75 100 125 T (°C) C Figure 7. Relative variation of holding and latching current versus junction temperature (typical values) Figure 8. Surge peak on-state current versus number of cycles I , [T ] / I , I [T = 25 °C] Hj H L j I L 0.0 0.4 0.8 1.2 1.6 -50 -25 0 25 50 75 100 125 IH IL T (°C) j I (A) TSM 0 50 100 1 10 100 1000 Number of cycles One cycle t = 20 ms Non repetitive T initial = 25 °C j Repetitive T = 95 °C c Figure 9. Non repetitive surge peak on-state current and corresponding value of I2T Figure 10. On-state characteristics (maximum values) I A), I²t (A²s) TSM( 10 100 1000 10000 0.01 0.10 1.00 10.00 t (ms) p sinusoidal pulse with width t <10 ms p dl/dt limitation: 100 A / µs I²t I TSM T initial = 25 °C j I (A) TM 1 10 100 012 345 Tj=25°C Tj=125°C V (V) TM T max: V = 0.85 V R = 40 m j to d Ω |
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