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ADXL362BCCZ-R2 数据表(PDF) 5 Page - Analog Devices |
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ADXL362BCCZ-R2 数据表(HTML) 5 Page - Analog Devices |
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5 / 44 page ![]() Data Sheet ADXL362 Rev. B | Page 5 of 44 Parameter Test Conditions/Comments Min Typ Max Unit Supply Current Measurement Mode 100 Hz ODR (50 Hz bandwidth)5 Normal Operation 1.8 µA Low Noise Mode 3.3 µA Ultralow Noise Mode 13 µA Wake-Up Mode 0.27 µA Standby 0.01 µA Power Supply Rejection Ratio (PSRR) CS = 1.0 µF, RS = 100 Ω, CIO = 1.1 µF, input is 100 mV sine wave on VS Input Frequency 100 Hz to 1 kHz −13 dB Input Frequency 1 kHz to 250 kHz −20 dB Turn-On Time 100 Hz ODR (50 Hz bandwidth) Power-Up to Standby 5 ms Measurement Mode Instruction to Valid Data 4/ODR TEMPERATURE SENSOR Bias @ 25°C 350 LSB Standard Deviation 290 LSB Sensitivity Average @ 25°C 0.065 °C/LSB Standard Deviation 0.0025 °C/LSB Sensitivity Repeatability @ 25°C ±0.5 °C Resolution 12 Bits ENVIRONMENTAL Operating Temperature Range −40 +85 °C 1 All minimum and maximum specifications are guaranteed. Typical specifications may not be guaranteed. 2 Cross axis sensitivity is defined as coupling between any two axes. 3 −40°C to +25°C or +25°C to +85°C. 4 Self test change is defined as the output change in g when self test is asserted. 5 Refer to Figure 30 for current consumption at other bandwidth settings. |
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