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PD70F3555 数据表(PDF) 11 Page - Renesas Technology Corp |
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PD70F3555 数据表(HTML) 11 Page - Renesas Technology Corp |
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11 / 88 page ![]() 11 R01DS0141ED0100 Data Sheet Chapter 1 Overview 1.2 Pin Groups 1.3 General measurement conditions 1.3.1 AC characteristic measurement condition AC test input waveform AC test output waveform Standard AC test condition is 70%/30% of the applied IO supply voltage (XmVDD) if not otherwise stated in the according AC timing specification of an interface. AC Test Condition: Ext. Capacitive Load Symbol Pin group supplied by Related pins / ports PgE0 E0VDD JP0, P0, _RESET, FLMD0, WAKE, VCPC0IN, VCPC1IN PgE1 E1VDD / E1VSS P1, P2, P3, P4 PgB0 B0VDD / B0VSS P21, P25, P27 PgOSC OSCVDD / OSCVSS X1, X2, XT1, XT2 PgA0 A0VDD / A0VSS P10, P11, ADCA0Im PgA1 A1VDD / A1VSS P12 xVSS xVDD xVSS xVDD DUT Load on test: CL= 50pF |
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