LMV331-N, LMV339-N, LMV393-N

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SNOS018G – AUGUST 1999 – REVISED FEBRUARY 2013

LMV331-N Single / LMV393-N Dual / LMV339-N Quad General Purpose, Low Voltage, Tiny

Pack Comparators

Check for Samples: LMV331-N, LMV339-N, LMV393-N

1

FEATURES

DESCRIPTION

The LMV393-N and LMV339-N are low voltage (2.7-

2

•

(For 5V Supply, Typical Unless Otherwise

5V) versions of the dual and quad comparators,

Noted)

LM393/339, which are specified at 5-30V. The

•

Guaranteed 2.7V and 5V Performance

LMV331-N is the single version, which is available in

•

Industrial Temperature Range

−40°C to +85°C

space saving 5-pin SC70 and 5-pin SOT23 packages.

The 5-pin SC70 is approximately half the size of the

•

Low Supply Current 60 µA/Channel

5-pin SOT23.

•

Input Common Mode Voltage Range Includes

The LMV393-N is available in 8-pin SOIC and

Ground

VSSOP. The LMV339-N is available in 14-pin SOIC

•

Low Output Saturation Voltage 200 mV

and TSSOP.

•

Propagation Delay 200 ns

The

LMV331-N/393-N/339-N

is

the

most

cost-

•

Space Saving 5-pin SC70 and 5-Pin SOT23

effective solution where space, low voltage, low

Packages

power and price are the primary specification in

circuit design for portable consumer products. They

APPLICATIONS

offer specifications that meet or exceed the familiar

LM393/339 at a fraction of the supply current.

•

Mobile Communications

The chips are built with TI's advanced Submicron

•

Notebooks and PDA's

Silicon-Gate BiCMOS process. The LMV331-N/393-

•

Battery Powered Electronics

N/339-N have bipolar input and output stages for

•

General Purpose Portable Device

improved noise performance.

•

General Purpose Low Voltage Applications

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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

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PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.