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TUSB2046BVF 数据表(PDF) 6 Page - Texas Instruments

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部件名 TUSB2046BVF
功能描述  4-PORT HUB FOR THE UNIVERSAL SERIAL BUSWITH OPTIONAL SERIAL EEPROM INTERFACE
PDF  25 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

TUSB2046BVF 数据表(HTML) 6 Page - Texas Instruments

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TUSB2046B
TUSB2046BI
SLLS413I – FEBRUARY 2000 – REVISED SEPTEMBER 2013
www.ti.com
THERMAL INFORMATION
TUSB2046BI
THERMAL METRIC(1)
RHB
UNITS
32 PINS
θJA
Junction-to-ambient thermal resistance(2)
35.7
θJCtop
Junction-to-case (top) thermal resistance(3)
28.4
θJB
Junction-to-board thermal resistance(4)
9.9
°C/W
ψJT
Junction-to-top characterization parameter(5)
0.5
ψJB
Junction-to-board characterization parameter(6)
9.8
θJCbot
Junction-to-case (bottom) thermal resistance(7)
4.3
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5)
The junction-to-top characterization parameter,
ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA, using a procedure described in JESD51-2a (sections 6 and 7).
(6)
The junction-to-board characterization parameter,
ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining
θJA , using a procedure described in JESD51-2a (sections 6 and 7).
(7)
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
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Copyright © 2000–2013, Texas Instruments Incorporated
Product Folder Links: TUSB2046B TUSB2046BI



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