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M95160-R 数据表(PDF) 33 Page - STMicroelectronics |
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M95160-R 数据表(HTML) 33 Page - STMicroelectronics |
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33 / 47 page ![]() DocID022580 Rev 4 33/47 M95160 M95160-W M95160-R M95160-DF DC and AC parameters 46 Figure 19. AC measurement I/O waveform Table 11. AC measurement conditions Symbol Parameter Min. Max. Unit CL Load capacitance 30 pF Input rise and fall times - 50 ns Input pulse voltages 0.2 VCC to 0.8 VCC V Input and output timing reference voltages 0.3 VCC to 0.7 VCC V Table 12. Cycling performance Symbol Parameter(1) 1. Cycling performance for products identified by process letter K. Test conditions Min. Max. Unit Ncycle Write cycle endurance TA ≤ 25 °C, VCC(min) < VCC < VCC(max) - 4,000,000 Write cycle TA = 85 °C, VCC(min) < VCC < VCC(max) - 1,200,000 Table 13. Memory cell data retention Parameter Test conditions Min. Unit Data retention(1) 1. For products identified by process letter K. The data retention behavior is checked in production, while the 200-year limit is defined from characterization and qualification results. TA = 55 °C 200 Year Table 14. Capacitance Symbol Parameter Test conditions(1) 1. Sampled only, not 100% tested, at TA = 25 °C and a frequency of 5 MHz. Min. Max. Unit COUT Output capacitance (Q) VOUT = 0 V - 8 pF CIN Input capacitance (D) VIN = 0 V - 8 pF Input capacitance (other pins) VIN = 0 V - 6 pF AI00825C 0.8 VCC 0.2 VCC 0.7 VCC 0.3 VCC Input and output timing reference levels Input voltage levels |
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