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ADL5372ACPZ-R21 数据表(PDF) 20 Page - Analog Devices |
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ADL5372ACPZ-R21 数据表(HTML) 20 Page - Analog Devices |
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20 / 24 page ![]() ADL5372 Rev. 0 | Page 20 of 24 FMOD TEST RACK SINGLE TO DIFFERENTIAL CIRCUIT BOARD Q IN DCCM AGND I IN DCCM VN1 VP1 I IN AC Q IN AC VPOS +5V LO 0° 90° IQ QP QN AGILENT 34401A MULTIMETER 0.200 ADC AGILENT E3631A POWER SUPPLY 5.000 0.350A COM 6V ±25V + – + – AGILENT E3631A POWER SUPPLY 0.500 0.010A COM VCM = 0.5V 6V ±25V + – + – R AND S FSEA 30 SPECTRUM ANALYZER 100MHz TO 4GHz +6dBm RF IN TEKTRONIX AFG3252 DUAL FUNCTION ARBITRARY FUNCTION GENERATOR 1MHz AMPL 700mV p-p PHASE 0° 1MHz AMPL 700mV p-p PHASE 90° CH1 CH2 RF OUT R AND S SMT 06 SIGNAL GENERATOR FREQ 4MHz TO 4GHz LEVEL 0dBm IN1 IN1 TSEN GND VPOSB VPOSA IP IN IP IN QP QN LO OUT OUTPUT GND VPOS +5V VPOS +5V –5V FMOD CHAR BD Figure 42. Setup for Baseband Frequency Sweep and Undesired Sideband Nulling The setup used to evaluate baseband frequency sweep and undesired sideband nulling of the ADL5372 is shown in Figure 42. The interface board has circuitry that converts the single-ended I input and Q input from the arbitrary function generator to differential I and Q baseband signals with a dc bias of 500 mV. Undesired sideband nulling was achieved through an iterative process of adjusting amplitude and phase on the Q-channel. See Sideband Suppression Optimization section for a detailed discussion on sideband nulling. |
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