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MAT12 数据表(PDF) 3 Page - Analog Devices |
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MAT12 数据表(HTML) 3 Page - Analog Devices |
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3 / 12 page ![]() MAT12 Rev. 0 | Page 3 of 12 SPECIFICATIONS ELECTRICAL CHARACTERISTICS VCB = 15 V, IO = 10 μA, TA = 25°C, unless otherwise specified. Table 1. Parameter Symbol Test Conditions/Comments Min Typ Max Unit DC AND AC CHARACTERISTICS Current Gain1 hFE IC = 1 mA 300 605 −40°C ≤ TA ≤ +85°C 300 IC = 10 μA 200 550 −40°C ≤ TA ≤ +85°C 200 Current Gain Match2 ΔhFE 10 μA ≤ IC ≤ 1 mA 0.5 5 % Noise Voltage Density3 eN IC = 1 mA, VCB = 0 V fO = 10 Hz 1.6 2 nV/√Hz fO = 100 Hz 0.9 1 nV/√Hz fO = 1 kHz 0.85 1 nV/√Hz fO = 10 kHz 0.85 1 nV/√Hz Low Frequency Noise (0.1 Hz to 10 Hz) eN p-p IC = 1 mA 0.4 μV p-p Offset Voltage VOS VCB = 0 V, IC = 1 mA 10 200 μV −40°C ≤ TA ≤ +85°C 220 μV Offset Voltage Change vs. VCB ΔVOS/ΔVCB 0 V ≤ VCB ≤ VMAX4,1 μA ≤ IC ≤ 1 mA5 10 50 μV Offset Voltage Change vs. IC ΔVOS/ΔIC 1 μA ≤ IC ≤ 1 mA5, VCB = 0 V 5 70 μV Offset Voltage Drift ΔVOS/ΔT −40°C ≤ TA ≤ +85°C 0.08 1 μV/°C −40°C ≤ TA ≤ +85°C, VOS trimmed to 0 V 0.03 0.3 μV/°C Breakdown Voltage, Collector to Emitter BVCEO 40 V Gain Bandwidth Product fT IC = 100 mA, VCE = 10 V 200 MHz Collector-to-Base Leakage Current ICBO VCB = VMAX 25 500 pA −40°C ≤ TA ≤ +85°C 3 nA Collector-to-Collector Leakage Current6, 7 ICC VCC = VMAX 35 500 pA −40°C ≤ TA ≤ +85°C 4 nA Collector-to-Emitter Leakage Current6, 7 ICES VCE = VMAX, VBE = 0 V 35 500 pA −40°C ≤ TA ≤ +85°C 4 nA Input Bias Current IB IC = 10 μA 50 nA −40°C ≤ TA ≤ +85°C 50 nA Input Offset Current IOS IC = 10 μA 6.2 nA −40°C ≤ TA ≤ +85°C 13 nA Input Offset Current Drift6 ΔIOS/ΔT IC = 10 μA, −40°C ≤ TA ≤ +85°C 40 150 pA/°C Collector Saturation Voltage VCE (SAT) IC = 1 mA, IB = 100 μA 0.05 0.2 V Output Capacitance COB VCB = 15 V, IE = 0 μA 23 pF Bulk Resistance6 RBE 10 μA ≤ IC ≤ 10 mA 0.3 1.6 Ω Collector-to-Collector Capacitance CCC VCC = 0 V 35 pF 1 Current gain is guaranteed with collector-to-base voltage (VCB) swept from 0 V to VMAX at the indicated collector currents. 2 Current gain match (ΔhFE) is defined as follows: ΔhFE = (100(ΔIB)(hFE min)/IC). 3 Noise voltage density is guaranteed, but not 100% tested. 4 This is the maximum change in VOS as VCB is swept from 0 V to 40 V. 5 Measured at IC = 10 μA and guaranteed by design over the specified range of IC. 6 Guaranteed by design. 7 ICC and ICES are verified by the measurement of ICBO. |
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