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GAL22V10D-25LS 数据表(PDF) 10 Page - Lattice Semiconductor

部件名 GAL22V10D-25LS
功能描述  Product Change Notifications (PCNs) have been issued to discontinue all devices in this data sheet.
PDF  23 Pages
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制造商  LATTICE [Lattice Semiconductor]
网页  http://www.latticesemi.com
标志 LATTICE - Lattice Semiconductor

GAL22V10D-25LS 数据表(HTML) 10 Page - Lattice Semiconductor

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Specifications GAL22V10
8
tpd
A
Input or I/O to Combinatorial Output
1
4
1
5
1
7.5
ns
tco
A
Clock to Output Delay
1
3.5
1
4
1
4.5
ns
tcf2
Clock to Feedback Delay
2.5
3
3
ns
tsu
Setup Time, Input or Fdbk before Clk↑
2.5
3
4.5
ns
th
Hold Time, Input or Fdbk after Clk↑
0
0—0—
ns
A
Maximum Clock Frequency with
167
142.8
111
MHz
External Feedback, 1/(tsu + tco)
fmax3
A
Maximum Clock Frequency with
200
166
133
MHz
Internal Feedback, 1/(tsu + tcf)
A
Maximum Clock Frequency with
250
200
166
MHz
No Feedback
twh
Clock Pulse Duration, High
2
2.5
3
ns
twl
Clock Pulse Duration, Low
2
2.5
3
ns
ten
B
Input or I/O to Output Enabled
1
5
1
6
1
7.5
ns
tdis
C
Input or I/O to Output Disabled
1
5
1
5.5
1
7.5
ns
tar
A
Input or I/O to Asynch. Reset of Reg.
1
4.5
1
5.5
1
9
ns
tarw
Asynch. Reset Pulse Duration
4.5
4.5
7
ns
tarr
Asynch. Reset to Clk↑ Recovery Time
3
4
5
ns
tspr
Synch. Preset to Clk↑ Recovery Time
3
4
5
ns
Over Recommended Operating Conditions
UNITS
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Description section.
3) Refer to fmax Description section. Characterized initially and after any design or process changes that may affect these
parameters.
PARAM
TEST
COND.1
DESCRIPTION
SYMBOL
PARAMETER
MAXIMUM*
UNITS
TEST CONDITIONS
C
I
Input Capacitance
8
pF
V
CC = 5.0V, VI = 2.0V
C
I/O
I/O Capacitance
8
pF
V
CC = 5.0V, VI/O = 2.0V
*Characterized but not 100% tested.
-5
MIN. MAX.
COM/IND
COM
-7
MIN. MAX.
AC Switching Characteristics
Capacitance (T
A = 25
°C, f = 1.0 MHz)
Specifications GAL22V10D
COM
-4
MIN. MAX.



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