GAL22V10D-25LS datasheet(14/23 Pages) LATTICE

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Specifications GAL22V10

GAL22V10D-4 Output Load Conditions (see figure below)

Test Condition

A50Ω

50pF

Z to Active High at 1.9V

50Ω

50pF

Z to Active Low at 1.0V

50Ω

50pF

Active High to Z at 1.9V

50Ω

50pF

Active Low to Z at 1.0V

50Ω

50pF

Input Pulse Levels

GND to 3.0V

Input Rise and

D-4/-5/-7

1.5ns 10% – 90%

Fall Times

D-10/-15/-20/-25

2.0ns 10% – 90%

Input Timing Reference Levels

1.5V

Output Timing Reference Levels

1.5V

Output Load

See Figure

3-state levels are measured 0.5V from steady-state active

level.

TEST POINT

C *

FROM OUTPUT (O/Q)

UNDER TEST

+5V

*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE

Output Load Conditions (except D-4) (see figure below)

Test Condition

300Ω

390Ω

50pF

Active High

∞

390Ω

50pF

Active Low

300Ω

390Ω

50pF

Active High

∞

390Ω

5pF

Active Low

300Ω

390Ω

5pF

TEST POINT

Z0 = 50Ω, CL*

FROM OUTPUT (O/Q)

UNDER TEST

+1.45V

Switching Test Conditions

GAL22V10D-25LS 数据表(PDF) 14 Page - Lattice Semiconductor

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