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AM29LL800B 数据表(PDF) 25 Page - Advanced Micro Devices |
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AM29LL800B 数据表(HTML) 25 Page - Advanced Micro Devices |
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25 / 40 page ![]() Am29LL800B 25 ADV ANCE I N FO RMAT I O N TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 2.5 V Device Under Test 21518A-14 Figure 12. Test Setup Note: Diodes are IN3064 or equivalent Test Condition -150 -200 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 50 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.4 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.5 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input 21518A-15 Figure 13. Input Waveforms and Measurement Levels |
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