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CY7C0430V 数据表(PDF) 26 Page - Cypress Semiconductor

部件名 CY7C0430V
功能描述  3.3V 64K x 18 Synchronous QuadPort??Static RAM
PDF  36 Pages
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制造商  CYPRESS [Cypress Semiconductor]
网页  http://www.cypress.com
标志 CYPRESS - Cypress Semiconductor

CY7C0430V 数据表(HTML) 26 Page - Cypress Semiconductor

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CY7C0430V
PRELIMINARY
26
Identification (ID) Register
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired
into the QuadPort and can be shifted out when the TAP con-
troller is in the Shift-DR state. The ID register has a vendor
code and other information described in the Identification Reg-
ister Definitions table.
TAP Instruction Set
Sixteen different instructions are possible with the 4-bit instruc-
tion register. All combinations are listed in Table 6, Instruction
Codes. Seven of these instructions (codes) are listed as RE-
SERVED and should not be used. The other nine instructions
are described in detail below.
The TAP controller used in this QuadPort is fully compliant to
the 1149.1 convention. The TAP controller can be used to load
address, data or control signals into the QuadPort and can
preload the Input or output buffers. The QuadPort implements
all of the 1149.1 instructions except INTEST. Table 6 lists all
instructions.
Instructions are loaded into the TAP controller during the
Shift-IR state when the instruction register is placed between
TDI and TDO. During this state, instructions are shifted
through the instruction register through the TDI and TDO pins.
To execute the instruction once it is shifted in, the TAP control-
ler needs to be moved into the Update-IR state.
EXTEST
EXTEST is a mandatory 1149.1 instruction which is to be exe-
cuted whenever the instruction register is loaded with all 0s. EX-
TEST allows circuitry external to the QuadPort package to be
tested. Boundary-scan register cells at output pins are used to
apply test stimuli, while those at input pins capture test results.
IDCODE
The IDCODE instruction causes a vendor-specific, 32-bit code
to be loaded into the instruction register. It also places the
instruction register between the TDI and TDO pins and allows
the IDCODE to be shifted out of the device when the TAP con-
troller enters the Shift-DR state. The IDCODE instruction is
loaded into the instruction register upon power-up or whenever
the TAP controller is given a test logic reset state.
High-Z
The High-Z instruction causes the boundary scan register to
be connected between the TDI and TDO pins when the TAP
controller is in a Shift-DR state. It also places all QuadPort
outputs into a High-Z state.
SAMPLE / PRELOAD
SAMPLE / PRELOAD is a 1149.1 mandatory instruction.
When the SAMPLE / PRELOAD instructions loaded into the
instruction register and the TAP controller in the Capture-DR
state, a snapshot of data on the inputs and output pins is cap-
tured in the boundary scan register.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 10 MHz, while the QuadPort clock
operates more than an order of magnitude faster. Because
there is a large difference in the clock frequencies, it is possible
that during the Capture-DR state, an input or output will under-
go a transition. The TAP may then try to capture a signal while
in transition (metastable state). This will not harm the device,
but there is no guarantee as to the value that will be captured.
Repeatable results may not be possible.
To guarantee that the boundary scan register will capture the
correct value of a signal, the QuadPort signal must be stabi-
lized long enough to meet the TAP controller's capture set-up
plus hold times. Once the data is captured, it is possible to shift
out the data by putting the TAP into the Shift-DR state. This
places the boundary scan register between the TDI and TDO
pins. If the TAP controller goes into the Update-DR state, the
sampled data will be updated.
BYPASS
When the BYPASS instruction is loaded in the instruction reg-
ister and the TAP is placed in a Shift-DR state, the bypass
register is placed between the TDI and TDO pins. The advan-
tage of the BYPASS instruction is that it shortens the boundary
scan path when multiple devices are connected together on a
board.
CLAMP
The optional CLAMP instruction allows the state of the signals
driven from QuadPort pins to be determined from the bound-
ary-scan register while the BYPASS register is selected as the
serial path between TDI and TDO. CLAMP controls boundary
cells to 1 or 0.
RUNBIST
RUNBIST instruction provides the user with a means of run-
ning a user-accessible self-test function within the QuadPort
as a result of a single instruction. This permits all components
on a board that offer the RUNBIST instruction to execute their
self-tests concurrently, providing a quick check for the board.
The QuadPort MBIST provides two modes of operation once
the TAP controller is loaded with the RUNBIST instruction:
Non-Debug Mode (Go-NoGo)
The non-debug mode is a go-nogo test used simply to run
BIST and obtain pass-fail information after the test is run. In
addition to that, the total number of failures encountered can
be obtained. This information is used to aid the debug mode
(explained next) of operation. The pass-fail information and
failure count is scanned out using the JTAG interface. An
MBIST Result Register (MRR) will be used to store the
pass-fail results. The MRR is a 25-bit register that will be con-
nected between TDI and TDO during the internal scan
(INT_SCAN) operation. The MRR will contain the total number
of fail read cycles of the entire MBIST sequence. MRR[0] (bit
0) is the Pass/Fail bit. A “1” indicates some type of failure oc-
curred, and a “0” indicates entire memory pass.
In order to run BIST in non-debug mode, the 2-bit MBIST Con-
trol Register (MCR) is loaded with the default value “00”, and
the TAP controller’s finite state machine (FSM), which is syn-
chronous to TCK, transitions to Run Test/Idle state. The entire
MBIST test will be performed with a deterministic number of
TCK cycles depending on the TCK and CLKBIST frequency.
tCYC is total number of TCK cycles required to run MBIST.
SPC is the Synchronization Padding Cycles (4–6 cycles)
m is a constant represents the number of read and write oper-
ations required to run MBIST algorithms (31,195,136).
t
CYC
t
CYC CLKBIST
[]
t
CYC TCK
[]
--------------------------------------------
mSPC
+
×
=



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