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NG80960JS25 数据表(PDF) 21 Page - Intel Corporation |
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NG80960JS25 数据表(HTML) 21 Page - Intel Corporation |
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21 / 86 page ![]() 80960JA/JF/JD/JS/JC/JT 3.3 V Embedded 32-Bit Microprocessor Datasheet 21 HOLDA O R(Q) H(1) P(Q) HOLD ACKNOWLEDGE indicates to an external bus master that the processor has relinquished control of the bus. The processor may grant HOLD requests and enter the Th state during reset and while halted as well as during regular operation. 0 = hold not acknowledged 1 = hold acknowledged BSTAT O R(0) H(Q) P(0) BUS STATUS indicates that the processor may soon stall unless it has sufficient access to the bus; see i960® Jx Microprocessor Developer’s Manual (272483). Arbitration logic may examine this signal to determine when an external bus master should acquire/relinquish the bus. 0 = no potential stall 1 = potential stall Table 9. Pin Description—Processor Control Signals, Test Signals, and Power (Sheet 1 of 2) NAME TYPE DESCRIPTION CLKIN I CLOCK INPUT provides the processor’s fundamental time base; both the processor core and the external bus run at the CLKIN rate. All input and output timings are specified relative to a rising CLKIN edge. RESET# I A(L) RESET initializes the processor and clears its internal logic. During reset, the processor places the address/data bus and control output pins in their idle (inactive) states. During reset, the input pins are ignored with the exception of LOCK#/ONCE#, STEST and HOLD. The RESET# pin has an internal synchronizer. To ensure predictable processor initialization during power up, RESET# must be asserted a minimum of 10,000 CLKIN cycles with VCC and CLKIN stable. On a warm reset, RESET# should be asserted for a minimum of 15 cycles. STEST I S(L) SELF TEST enables or disables the processor’s internal self-test feature at initialization. STEST is examined at the end of reset. When STEST is asserted, the processor performs its internal self-test and the external bus confidence test. When STEST is deasserted, the processor performs only the external bus confidence test. 0 = self test disabled 1 = self test enabled FAIL# O R(0) H(Q) P(1) FAIL indicates a failure of the processor’s built-in self-test performed during initialization. FAIL# is asserted immediately upon reset and toggles during self-test to indicate the status of individual tests: • When self-test passes, the processor deasserts FAIL# and begins operation from user code. • When self-test fails, the processor asserts FAIL# and then stops executing. 0 = self test failed 1 = self test passed TCK I TEST CLOCK is a CPU input which provides the clocking function for IEEE 1149.1 Boundary Scan Testing (JTAG). State information and data are clocked into the processor on the rising edge; data is clocked out of the processor on the falling edge. TDI I S(L) TEST DATA INPUT is the serial input pin for JTAG. TDI is sampled on the rising edge of TCK, during the SHIFT-IR and SHIFT-DR states of the Test Access Port. Table 8. Pin Description—External Bus Signals (Sheet 4 of 4) NAME TYPE DESCRIPTION |
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