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STL3NK40 数据表(PDF) 4 Page - STMicroelectronics |
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STL3NK40 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 16 page ![]() Electrical characteristics STL3NK40 4/16 DocID16246 Rev 2 2 Electrical characteristics (TCASE = 25 °C unless otherwise specified) Table 5. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage ID = 1 mA, VGS = 0 400 V IDSS Zero gate voltage drain current (VGS = 0) VDS = 400 V VDS = 400 V, TC = 125 °C 1 50 µA µA IGSS Gate-body leakage current (VDS = 0) VGS = ± 20 V ± 10 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 50 µA 0.8 1.6 2 V RDS(on) Static drain-source on- resistance VGS = 10 V, ID = 0.22 A 4.5 5.5 Ω Table 6. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit gfs (1) 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5% Forward transconductance VDS = 10 V, ID = 0.43 A - 1.2 S Ciss Input capacitance VDS = 25 V, f = 1 MHz, VGS = 0 - 128 200 pF Coss Output capacitance - 16 30 pF Crss Reverse transfer capacitance -4 6 pF RG Gate input resistance f= 1 MHz Gate DC Bias = 0 Test signal level = 20 mV open drain -12 Ω Qg Total gate charge VDD = 320 V, ID = 1.4 A, VGS = 10 V (see Figure 10) - 8.7 13 nC Qgs Gate-source charge - 0.9 nC Qgd Gate-drain charge - 3.8 nC |
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