ICS620-01

Digital Still Camera Clock Source

MDS 620-01 B

3

Revision 072098

Printed 12/4/00

Integrated Circuit Systems • 1271 Parkmoor Ave.•San Jose•CA•95126•(408)295-9800tel•(408)295-9818fax

PRELIMINARY INFORMATION

I C R O

Electrical Specifications

External Components

The ICS620-01 requires some inexpensive external components for proper operation. Decoupling capacitors of 0.1µF should be

connected on VDD pins 5, 7+8, and 21 to ground, as close to the ICS620-01 as possible. A series termination resistor of 33

Ω should

be used for each clock output. The 14.31818 MHz crystal should be parallel resonant with an accuracy of 30ppm or better. For

Parameter

Conditions

Minimum

Typical

Maximum

Units

ABSOLUTE MAXIMUM RATINGS

Supply Voltage, VDD

Referenced to GND

7

V

Inputs and Clock Outputs

Referenced to GND

-0.5

VDD+0.5

V

Ambient Operating Temperature

0

70

°C

Soldering Temperature

Max of 10 seconds

260

°C

Storage temperature

-65

150

°C

DC CHARACTERISTICS

Operating Voltage, VDD

3

5.5

V

Input High Voltage, VIH

Pins 6, 16, 20, 24, 27

2

V

Input Low Voltage, VIL

Pins 6, 16, 20, 24, 27

0.8

V

Input High Voltage, VIH

Pins 1, 9, 28

VDD-0.5

V

Input Mid-level Voltage

Pins 1, 9, 28

Leave pin unconnected or tri-stated

Leave pin unconnected or tri-stated

Leave pin unconnected or tri-stated

V

Input Low Voltage, VIL

Pins 1, 9, 28

0.5

V

Output High Voltage, VOH

IOH=-4mA

VDD-0.4

V

Output High Voltage, VOH

IOH=-25mA

2.4

V

Output Low Voltage, VOL

IOL=25mA

0.4

V

Operating Supply Current, IDD

No Load

TBD

mA

Short Circuit Current

Each output

±70

mA

On-Chip Pull-up Resistor

Pins 6, 16, 20, 24, 27

250

k

Ω

Input Capacitance

All inputs but X1

7

pF

AC CHARACTERISTICS

Input Frequency

14.31818

MHz

Output Clock Rise Time

0.8 to 2.0V

TBD

ns

Output Clock Fall Time

2.0 to 0.8V

TBD

ns

Output Clock Duty Cycle

at VDD/2

45

49 to 51

55

%

Absolute Jitter

TBD

ps

Note:

1. Stresses beyond those listed under Absolute Maximum Ratings could cause permanent damage to the device. Prolonged exposure

to levels above the operating limits but below the Absolute Maximums may affect device reliability.