6.04

5

IDT7134SA/LA

HIGH-SPEED 4K x 8 DUAL-PORT STATIC RAM

MILITARY AND COMMERCIAL TEMPERATURE RANGES

AC ELECTRICAL CHARACTERISTICS OVER THE

7134X45

7134X55

7134X70

Symbol

Parameter

Min.

Max.

Min.

Max.

Min.

Max.

Unit

READ CYCLE

Read Cycle Time

45

—

55

—

70

—

ns

Address Access Time

—

45

—

55

—

70

ns

Chip Enable Access Time

—

45

—

55

—

70

ns

Output Enable Access Time

—

25

—

30

—

40

ns

Output Hold from Address Change

0

—

0

—

0

—

ns

Output Low-Z Time

(1, 2)

5—

5

—

5—

ns

Output High-Z Time

(1, 2)

—20—

25

—30

ns

Chip Enable to Power Up Time

(2)

0—

0

—

0—

ns

Chip Disable to Power Down Time

(2)

—45—

50

—50

ns

NOTES:

2720 tbl 09

1. Transition is measured

±500mV from Low or High-impedance voltage with the Output Test Load (Figure 2).

2. This parameter is guaranteed by device characterization, but is not production tested.

3. (Commercial only) 0

°C to +70°C temperature range only.

4. “X” in part number indicates power rating (SA or LA).

AC ELECTRICAL CHARACTERISTICS OVER THE

7134X20

(3)

7134X25

7134X35

Symbol

Parameter

Min.

Max.

Min.

Max.

Min.

Max.

Unit

READ CYCLE

Read Cycle Time

20

—

25

—

35

—

ns

Address Access Time

—

20

—

25

—

35

ns

Chip Enable Access Time

—

20

—

25

—

35

ns

Output Enable Access Time

—

15

—

15

—

20

ns

Output Hold from Address Change

0

—

0

—

0

—

ns

Output Low-Z Time

(1, 2)

0

—

0—

0—

ns

Output High-Z Time

(1, 2)

—15

—

15

—

20

ns

Chip Enable to Power Up Time

(2)

0

—

0—

0—

ns

Chip Disable to Power Down Time

(2)

—20

—

25

—

35

ns

NOTES:

1. Timing depends on which signal is asserted last,

OE or CE.

2. Timing depends on which signal is de-asserted first,

OE or CE.

3. R/

ADDRESS

PREVIOUS DATA VALID

DATA VALID

2720 drw 08