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AN2684 数据表(PDF) 12 Page - STMicroelectronics |
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AN2684 数据表(HTML) 12 Page - STMicroelectronics |
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12 / 21 page ![]() IFP006V1 demonstration board description AN2684 12/21 Doc ID 14266 Rev 1 In particular Figure 11 and 12 show 3D thermal modelization of the device. 4.5 EMC immunity test 4.5.1 Description IFP006V1 has been tested according to EMC immunity standards IEC61000-4-4 (fast transient burst) and IEC61000-4-5 (high energy surge). A fast transient burst test has been performed all channels. Each channel under test is cycling ON and OFF at 1 Hz, duty cycle 50%, on four 48 Ω load resistors at 24 Vdc supply voltage. A burst signal was applied using an ultra-compact simulator with an internal capacitive coupling clamp tool. 4.5.2 Test conditions ● Ambient temperature: 25.6 °C ● Ambient humidity: 46% ● Main voltage power supply: 24 Vdc ● DC insulated voltage: 5 Vdc ● Loads: 4 x 48 Ω power resistor Figure 11. Steady state thermal behavior 3D simulation Figure 12. Repetitive demagnetization thermal behavior 3D simulation (1 Hz repetitive cycling on 48 Ω 1.2 H load) AM01853v1 AM01854v1 |
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