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AN2684 数据表(PDF) 13 Page - STMicroelectronics |
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AN2684 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 21 page ![]() AN2684 IFP006V1 demonstration board description Doc ID 14266 Rev 1 13/21 4.5.3 Burst immunity test Table 3 gives the burst setup configuration adopted to perform this test. Figure 13 below shows the standard timing waveform applied during the burst test. Figure 13. Burst timing waveform Table 4 shows the results of an inherent burst test. Normal performance has been observed when applying four different disturbance levels on the output ports and Vcc main voltage power supply. Table 3. Burst setup configuration Test level Condition Pulse time rt 5 ns ± 30% Pulse duration td 50 ns ± 30% Source impedance Zq = 50 Ω ± 20% Polarity Positive / negative Burst duration (td) 15 ms ± 20% Burst frequency (f) 5 kHz Burst period (tr) 300 ms ± 20% Duration time (T) 5 min |
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