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AN2985 数据表(PDF) 13 Page - STMicroelectronics |
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AN2985 数据表(HTML) 13 Page - STMicroelectronics |
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13 / 19 page ![]() AN2985 EMC immunity tests Doc ID 15716 Rev 2 13/19 Figure 13. Burst timing waveform Table 4 shows the results of a burst test. Normal performance has been observed when applying two different disturbance levels on the output ports and Vcc main voltage power supply. 2.3 Surge test A high energy surge test was performed in differential mode. A high surge signal was injected on the DUT (device under test) through a 42 Ω decoupling resistor. The test consisted of three positive and three negative discharges with a repetition rate of 1 discharge per minute. Figure 14 shows the standard timing waveform applied on the DUT. Table 4. Burst test results Burst standard test routines Level Voltage level (kV) Acceptance criteria(1) 1. Classification of the test: (Criteria A): normal performance (Criteria B): temporary degradation or loss of function or performance with automatic return to normal operation (Criteria C): temporary degradation or loss of function with external intervention to recover normal operation (Criteria D): degradation or loss of function, need replacement of damaged components to recover normal operation. IEC 61000-4-4 Level 1 0.5 A IEC 61000-4-4 Level 2 1 A IEC 61000-4-4 Level 3 2 A IEC 61000-4-4 Level 4 4 A |
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