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AN2985 数据表(PDF) 14 Page - STMicroelectronics |
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AN2985 数据表(HTML) 14 Page - STMicroelectronics |
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14 / 19 page ![]() EMC immunity tests AN2985 14/19 Doc ID 15716 Rev 2 Figure 14. Surge standard timing waveform Table 5 below shows normal performance of the device. Table 5. Surge test results Surge standard test routines Level Voltage level (Kv) Acceptance criteria(1) 1. Classification of the test: (Criteria A): normal performance (Criteria B): temporary degradation or loss of function or performance with automatic return to normal operation (Criteria C): temporary degradation or loss of function with external intervention to recover normal operation (Criteria D): degradation or loss of function, need substitution of damaged components to recover normal operation. IEC 61000-4-5 Level 1 0.5 A IEC 61000-4-5 Level 2 1 A IEC 61000-4-5 Level 3 2 A |
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