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AN3307 数据表(PDF) 31 Page - STMicroelectronics |
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AN3307 数据表(HTML) 31 Page - STMicroelectronics |
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31 / 37 page ![]() AN3307 Class B solution structure Doc ID 18186 Rev 4 31/37 5.4.2 CPU light runtime self-test The light runtime CPU core self-tests is a simplified version of the runtime test described in Section 5.4.1: Runtime self-test structure. The flags and stack pointers are not tested. If an error code is returned the Fail Save procedure is called. Figure 16. CPU light runtime self-test structure 5.4.3 Stack boundaries runtime test This test checks the magic pattern stored at the top of the space reserved for the stack. If the original pattern is corrupted, the Fail Safe routine is called. The pattern is placed at the lowest address reserved for the stack area. It can detect both overflow and underflow as the stack pointer rolls over this range in either case. The stack area differs depending on the specific microcontroller device type. Be careful of the stack area limits when the location of the pattern is changed. Figure 17. Stack overflow runtime test structure MS18902V1 Push R0 - R 13 Pop R0 – R13 Test OK Fail Safe routine Test R0 – R13 Fail Verify ramp pattern R 0 – R13 Fail Test OK FailSafe () routine Fail Any difference ? Yes No AI18013 Check lower pattern |
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