Data Sheet

8

Rev. 1.1, 2015-07-27

TLS820F0

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note:

1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

2. Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are not

designed for continuous repetitive operation.

Table 1

T

1) Not subject to production test, specified by design.

Parameter

Symbol

Values

Unit Note /

Test Condition

Number

Min.

Typ.

Max.

Input I, Enable EN

Voltage

V

-0.3

–

45

V

–

P_4.1.1

Output Q, Reset Output RO, Watchdog Output WO

Voltage

V

V

WO

-0.3

–

7

V

–

P_4.1.3

Watchdog Input WI, Delay Timing DT1 and DT2, Reset Threshold Adjustment RADJ

Voltage

V

V

-0.3

–

7

V

–

P_4.1.5

Temperatures

Junction Temperature

T

j

-40

–

150

°C

–

P_4.1.7

Storage Temperature

T

stg

-55

–

150

°C

–

P_4.1.8

ESD Absorption

ESD Susceptibility to GND

V

ESD

-2

–

2

kV

2) ESD susceptibility, HBM according to ANSI/ESDA/JEDEC JS001 (1.5 kΩ, 100 pF)

P_4.1.9

ESD Susceptibility to GND

V

ESD

-500

–

500

V

3) ESD susceptibility, Charged Device Model “CDM” according JEDEC JESD22-C101

P_4.1.10

ESD Susceptibility Pin 1, 7, 8, 14 (corner

pins) to GND

V

ESD1,7,8,14

-750

–

750

V

3) CDM

P_4.1.11