AM29F016D datasheet(44/45 Pages) AMD

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Am29F016D

REVISION SUMMARY

Revision A (May 1997)

Initial release of Am29F016B (0.35 µm) device.

Revision B (January 1998)

Global

Made formatting and layout consistent with other data

sheets. Used updated common tables and diagrams.

Revision B+1 (January 1998)

AC Characteristics—Read-only Operations

Deleted note referring to output driver disable time.

Figure 16—Temporary Sector Group Unprotect

Timings

Corrected title to indicate “sector group.”

Revision B+2 (April 1998)

Global

Added -70 speed option, deleted -75 speed option.

Distinctive Characteristics

Changed minimum 100K write/erase cycles guaran-

teed to 1,000,000.

Ordering Information

Added extended temperature availability to -90, -120,

and -150 speed options.

Operating Ranges

Added extended temperature range.

DC Characteristics, CMOS Compatible

Corrected the CE# and RESET# test conditions for

ICC3 and ICC4 to VCC ±0.5 V.

AC Characteristics

Erase/Program Operations; Erase and Program Oper-

ations Alternate CE# Controlled Writes: Corrected the

notes reference for tWHWH1 and tWHWH2. These param-

eters are 100% tested. Corrected the note reference for

tVCS. This parameter is not 100% tested.

Temporary Sector Unprotect Table

Added note reference for tVIDR. This parameter is not

100% tested.

Erase and Programming Performance

Changed minimum 100K program and erase cycles

guaranteed to 1,000,000.

Revision C (January 1999)

Global

Updated for CS39S process technology.

Distinctive Characteristics

Added:

s 20-year data retention at 125

°C

— Reliable operation for the life of the system

DC Characteristics—CMOS Compatible

ICC3, ICC4: Added Note 4, “For CMOS mode only ICC3,

ICC4 = 20 µA at extended temperature (>+85°C)”.

DC Characteristics—TTL/NMOS Compatible and

CMOS Compatible

ICC1, ICC2, ICC3, ICC4: Added Note 2 “Maximum ICC

specifications are tested with VCC = VCCmax”.

ICC3, ICC4: Deleted VCC = VCCMax.

Revision C+1 (March 23, 1999)

Operating Ranges

The temperature ranges are now specified as ambient.

Revision C+2 (May 17, 1999)

Product Selector Guide

Corrected the tOE specification for the -150 speed op-

tion to 55 ns.

Operating Ranges

VCC Supply Voltages: Added “VCC for ± 5% devices .

+4.75 V to +5.25 V”.

Revision C+3 (July 2, 1999)

Global

Added references to availability of device in Known

Good Die (KGD) form.

Revision D (November 16, 1999)

AC Characteristics—Figure 11. Program

Operations Timing and Figure 12. Chip/Sector

Erase Operations

Deleted tGHWL and changed OE# waveform to start at

high.

Physical Dimensions

Replaced figures with more detailed illustrations.

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