6-4

ESD Capability

ESD capability is dependent on the application and defined

test standard. The evaluation results for various test

standards and methods based on Figure 1 are shown in

Table 1.

For the “Modified” MIL-STD-3015.7 condition that is defined

as an “in-circuit” method of ESD testing, the V+ and V- pins

have a return path to ground and the SP720 ESD capability

is typically greater than 15kV from 100pF through 1.5k

Ω. By

strict definition of MIL-STD-3015.7 using “pin-to-pin” device

testing, the ESD voltage capability is greater than 6kV. The

MIL-STD-3015.7 results were determined from AT&T ESD

Test Lab measurements.

The HBM capability to the IEC 1000-4-2 standard is greater

than 15kV for air discharge (Level 4) and greater than 4kV

for direct discharge (Level 2). Dual pin capability (2 adjacent

pins in parallel) is well in excess of 8kV (Level 4).

For ESD testing of the SP720 to EIAJ IC121 Machine Model

(MM) standard, the results are typically better than 1kV from

200pF with no series resistance.

Absolute Maximum Ratings

Thermal Information

Continuous Supply Voltage, (V+) - (V-) . . . . . . . . . . . . . . . . . . +35V

(Refer to Figure 6) . . . . . . . . . . . . . . . . . . . . . . . . . . .

±2A, 100µs

ESD Ratings and Capability (Figure 1, Table 1)

Load Dump and Reverse Battery (Note 2)

Thermal Resistance (Typical, Note 1) . . . . . . . . . . . . .

PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

90

SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

130

(SOIC Lead Tips Only)

CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the

device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

NOTE:

1.

Electrical Specifications

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNITS

Operating Voltage Range,

-

2 to 30

-

V

Forward Voltage Drop:

IN to V-

IN to V+

-

-

2

2

-

-

V

V

Input Leakage Current

-20

5

20

nA

Quiescent Supply Current

-

50

200

nA

Equivalent SCR ON Threshold

Note 3

-

1.1

-

V

Equivalent SCR ON Resistance

-

1

-

Ω

Input Capacitance

-3-

pF

Input Switching Speed

-2-

ns

NOTES:

2. In automotive and battery operated systems, the power supply lines should be externally protected for load dump and reverse battery. When the

V+ and V- pins are connected to the same supply voltage source as the device or control line under protection, a current limiting resistor should

be connected in series between the external supply and the SP720 supply pins to limit reverse battery current to within the rated maximum

limits. Bypass capacitors of typically 0.01

µF or larger from the V+ and V- pins to ground are recommended.

3. Refer to the Figure 3 graph for definitions of equivalent “SCR ON Threshold” and “SCR ON Resistance.” These characteristics are given here

for thumb-rule information to determine peak current and dissipation under EOS conditions.

TABLE 1. ESD TEST CONDITIONS

STANDARD

TYPE/MODE

MIL STD 3015.7 Modified HBM

1.5k

Ω 100pF 15kV

Standard HBM

1.5k

Ω 100pF 6kV

IEC 1000-4-2

HBM, Air Discharge

330

Ω 150pF 15kV

HBM, Direct Discharge

330

Ω 150pF 4kV

HBM, Direct Discharge,

Two Parallel Input Pins

330

Ω 150pF 8kV

EIAJ IC121

Machine Model

0k

Ω 200pF 1kV

H.V.

SUPPLY

°

IN

DUT

CHARGE

SWITCH

DISCHARGE

SWITCH

FIGURE 1. ELECTROSTATIC DISCHARGE TEST

SP720