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TUSB4041IPAP 数据表(PDF) 8 Page - Texas Instruments

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部件名 TUSB4041IPAP
功能描述  Four-Port USB 2.0 Hub
PDF  44 Pages
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TUSB4041IPAP 数据表(HTML) 8 Page - Texas Instruments

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TUSB4041I
SLLSEK3B – JULY 2015 – REVISED DECEMBER 2015
www.ti.com
Pin Functions (continued)
PIN
I/O(1)
TYPE(1)
DESCRIPTION
NAME
NO.
TEST
17
I
PD
This pin is reserved for factory test.
POWER AND GROUND SIGNALS
28
NC
No connection, leave floating
40
19
25
37
VDD
45
PWR
1.1-V power rail
53
60
63
2
20
VDD33
PWR
3.3-V power rail
31
48
Thermal Pad
Ground. The thermal pad must be connected to ground.
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature (unless otherwise noted)
(1)
MIN
MAX
UNIT
VDD steady-state supply voltage
–0.3
1.4
V
Supply voltage
VDD33 steady-state supply voltage
–0.3
3.8
V
USB_VBUS pin
–0.3
1.4
V
Voltage
XI pins
–0.3
2.45
V
All other pins
–0.3
3.8
V
Storage temperature, Tstg
–65
150
°C
(1)
Stresses beyond those listed as Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated as Recommended Operating Conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
VALUE
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±4000
V(ESD)
Electrostatic discharge
V
Charged-device model (CDM), per JEDEC specification JESD22-
±1000
C101(2)
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
8
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Copyright © 2015, Texas Instruments Incorporated
Product Folder Links: TUSB4041I



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