SN74LVC1G97

SCES416M – DECEMBER 2002 – REVISED JUNE 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

–0.5

6.5

V

–0.5

6.5

V

–0.5

6.5

V

–0.5

V

Input clamp current

–50

mA

Output clamp current

–50

mA

Continuous output current

±50

mA

±100

mA

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

6.2 ESD Ratings

VALUE

UNIT

±2000

Electrostatic

V

discharge

±1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

See

(1)

MIN

MAX

UNIT

Operating

1.65

5.5

Supply voltage

V

Data retention

1.5

only

Input voltage

0

5.5

V

Output voltage

0

V

–4

–8

High-level output current

–16

mA

–24

–32

4

8

Low-level output current

16

mA

24

32

Operating free-air temperature

–40

125

°C

(1)

Implications of Slow or Floating CMOS Inputs, SCBA004.

4

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