JH177128160B

VER: 1.0

- 13 -

Issue date: 2013/08/12

JEWEL HILL ELECTRONIC CO.,LTD.

Unless otherwise agreed upon in writing, the sampling inspection shall be applied to the

Customer’s incoming inspection.

1) Lot size: Quantity per shipment lot

2) Sampling type: Normal inspection , single sampling

3) Inspection level: Ⅱ

4) Sampling table: MIL-STD-105D

5) Acceptable Quality Level(AQL): Major=0.65 Minor=1.5

11.2. Inspection Method

1) Ambient Condition:

a. Temperature: Room temperature 25±5℃

b. Illumination: Single fluorescent lamp non-directive(300 to 700 Lux)

2) Viewing distance

The distance between the LCD and the inspector’s eyes shall be at least 30-50cm.

3) Viewing Angle

The inspection shall be conducted within normal viewing angle range.

11.3. Inspection Criteria

11.3.1. Major defect

No.

Item

Inspection Standard

Classification

of defects

1

All

functional

defects

1) No display

2) Display abnormally

3) Open or missing segment

4) Short circuit

5) Excess power consumption

6) Backlight no lighting, flickering and abnormal lighting

Major

2

Missing

Missing component

Major

3

Outline

dimension

Overall outline dimension beyond the drawing is not

allowed

Major

11.3.2. Cosmetic Defect