JH177128160B

VER: 1.0

- 12 -

Issue date: 2013/08/12

JEWEL HILL ELECTRONIC CO.,LTD.

(VCC=1.65~3.1 V)

10.Reliability and Inspection Standard

No.

Test Item

Test Conditions

Remark

Storage

80℃, 120Hr

Note

1

High Temperature

Operation

70℃, 120Hr

Note

Storage

-30℃, 120Hr

2

Low Temperature

Operation

-20℃, 120Hr

Note

3

High Temperature and High

Humidity

60℃, 90%RH, 120Hr

Note

Storage

-10℃(1Hr) 25℃(5min) 60℃(1Hr)

32 Cycles

4

Temperature Cycle

Operation

-20℃(1Hr) 25℃(5min) 60℃(1Hr)

25 Cycles

Note

5

Peeling Off (Storage)

≧

500gf/cm

Note

6

FPC Bending Test

≧

6,000 times, 2/sec

Note

7

Vibration Test(Storage)

50HZ, 30min,

Amplitude: 2 cm, X/Y/Z directions

Note

8

Drop Test

60cm/ 3Corner/ 8Face, 1Cycle

Note

Note:

1) The test samples should be applied to only one test item.

2) Sample size for each test item is 5~10pcs.

3) For Damp Proof Test, pure water(Resistance>1MΩ) should be used.

4) In case of malfunction defect caused by ESD damage, if it would be recovered to

normal state after resetting, it would be judged as a good part.

5) EL evaluation should be excepted from reliability test with humidity and temperature:

Some defects such as black spot/blemish can happen by natural chemical reaction

with humidity and fluorescence EL has.

6) After the reliability test, the test samples should be inspected after 2 hours at least.

7) Functional test is OK. Missing segment, shorts, unclear segment, non display,

display abnormally, liquid crystal leak are not allowed.

8) After testing, the current Idd should be within initial value ±20%.

9) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble

growing are allowable in the appearance test.

11.Inspection Criterion

11.1. Sampling Method