Final Datasheet TLE 6263

Version 2.08

29

2004-06-07

Propagation delay

TxD-to-RxD HIGH (dominant

to recessive)

–1.3

2.0

µs

failures and bus failure

cases 1, 2, 3a and 4

–2.5

3.5

µs

failure and failure

cases 1, 2, 3a and 4

–1.3

2.1

µs

cases 3, 5, 6, 6a and 7

–1.7

2.6

µs

cases 3, 5, 6, 6a and 7

Edge-count difference

(falling edge) between CANH

and CANL for failure cases 1,

2, 3a and 4 detection

–4

––

Edge-count difference (rising

edge) between CANH and

CANL for failure cases 1, 2,

3a and 4 recovery

–2

––

TxD permanent dominant

disable time

1.32.0

3.5ms

SPI-Interface

Logic Inputs DI, CLK and CSN

H-input voltage threshold

V

IH

–

–

0.7 x

V

CC

V

–

L-input voltage threshold

V

IL

0.3 x

V

CC

––

V

–

Hysteresis of input voltage

V

IHY

50

200

500

mV

–

Pull up current at pin CSN

I

ICSN

–100 –25

– 5

µA

7.3

Electrical Characteristics (cont’d)

characteristics); all voltages with respect to ground; positive current defined flowing into pin; unless otherwise

specified.

Parameter

Symbol

Limit Values

Unit Test Condition

min.

typ.

max.